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Hard X-ray photoelectron and X-ray absorption spectroscopy characterization of oxidized surfaces of iron sulfides

机译:硫化铁氧化表面的硬X射线光电子和X射线吸收光谱表征

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摘要

Hard X-ray photoelectron spectroscopy (HAXPES) using an excitation energy range of 2 keV to 6 keV in combination with Fe K- and S K-edge XANES, measured simultaneously in total electron (TEY) and partial fluorescence yield (PFY) modes, have been applied to study near-surface regions of natural polycrystalline pyrite FeS2 and pyrrhotite Fe1-xS before and after etching treatments in an acidic ferric chloride solution. It was found that the following near-surface regions are formed owing to the preferential release of iron from oxidized metal sulfide lattices: (i) a thin, no more than 1-4 nm in depth, outer layer containing polysulfide species, (ii) a layer exhibiting less pronounced stoichiometry deviations and low, if any, concentrations of polysulfide, the composition and dimensions of which vary for pyrite and pyrrhotite and depend on the chemical treatment, and (iii) an extended almost stoichiometric underlayer yielding modified TEY XANES spectra, probably, due to a higher content of defects. We suggest that the extended layered structure should heavily affect the near-surface electronic properties, and processes involving the surface and interfacial charge transfer. (C) 2016 Elsevier B.V. All rights reserved.
机译:硬X射线光电子能谱(HAXPES),其激发能量范围为2 keV至6 keV,并与Fe K-和S K-edge XANES结合使用,同时在全电子(TEY)和部分荧光产率(PFY)模式下进行测量,已经被用于研究在酸性氯化铁溶液中蚀刻处理之前和之后的天然多晶黄铁矿FeS2和黄铁矿Fe1-xS的近表面区域。发现由于铁优先从氧化的金属硫化物晶格释放而形成以下近表面区域:(i)厚度不超过1-4 nm的薄薄的外层,其中含有多硫化物,(ii)表现出较不明显的化学计量偏差和较低的多硫化物浓度的层,该硫化物的成分和尺寸因黄铁矿和黄铁矿而异,并取决于化学处理,并且(iii)扩展了几乎化学计量的下层,产生了改良的TEY XANES光谱,可能是由于缺陷含量较高。我们建议扩展的层状结构应严重影响近表面的电子性能以及涉及表面和界面电荷转移的过程。 (C)2016 Elsevier B.V.保留所有权利。

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